| Fixed-Magnification Object-Space Telecentric Lens | Chief rays remain nearly parallel to the optical axis in object space, so the entrance pupil is effectively positioned at infinity. | Usually below 0.1°; premium designs can be lower. | Typically below 0.1%; high-performance models may approach 0.01%. | Precisely defined and generally fixed; object movement within the specified telecentric range causes very little scale change. | Stable magnification, low perspective error, controlled numerical aperture, and high measurement repeatability. | Dimensional gauging, connector inspection, precision parts, molded components, and machine-vision measurement. |
| Bi-Telecentric Lens | Chief rays are telecentric on both the object and image sides, keeping magnification stable when either the object or sensor position changes slightly. | Object-side and image-side telecentricity are both tightly controlled. | Often below 0.1%; selected metrology designs can be significantly lower. | Requires careful alignment of the object plane, lens, and sensor; offers the highest tolerance to small positioning errors. | Very low perspective distortion, stable image scale, improved edge measurement, and consistent illumination geometry. | High-accuracy metrology, semiconductor and electronics inspection, flat-part measurement, and calibration targets. |
| Object-Space Telecentric Macro Lens | Uses a telecentric front optical group to maintain parallel chief rays while imaging at short object distances and high magnification. | Commonly below 0.1° within the specified object-side field. | Usually below 0.2%, depending on magnification and field size. | Short to medium fixed working distance, often optimized for close-up inspection. | High resolving power, strong correction of perspective, and compatibility with coaxial or ring illumination. | Small mechanical parts, solder joints, medical components, precision plastics, and surface-feature inspection. |
| Object-Space Telecentric Zoom Lens | Maintains object-side telecentricity over a defined magnification range through synchronized movement of internal optical groups. | Typically below 0.2° across the specified zoom range; performance varies with zoom position. | Often below 0.3%, but may change as magnification is adjusted. | May remain approximately constant or change within a controlled range, depending on the optical design. | Adjustable magnification, telecentric stop control, flexible field coverage, and easier adaptation to different part sizes. | Multi-format inspection systems, laboratory imaging, production lines with varying part dimensions, and prototype inspection. |
| Large-Object-Space Telecentric Lens | Provides parallel object-side chief rays across a comparatively large field, reducing size errors over wide components. | Commonly below 0.2° across the usable field. | Typically below 0.2% to 0.5%, depending on field size and magnification. | Usually medium to long and carefully specified to preserve telecentric performance across the entire field. | Large clear aperture, uniform scale across the field, broad illumination access, and robust mechanical packaging. | Battery cells, automotive components, trays, wafers, large molded parts, and sheet-material inspection. |
| High-NA Object-Space Telecentric Lens | Combines object-side telecentricity with a relatively large numerical aperture to collect more light and resolve finer details. | Usually below 0.1° within the designed field and aperture setting. | Typically below 0.1% in metrology-oriented designs. | Fixed and sensitive to focus position; precise mechanical mounting is important. | High light-gathering capability, improved resolution, shorter depth of field, and strong performance with small features. | Micrometer-scale inspection, precision machining, fine-edge measurement, and high-contrast component analysis. |
| Low-NA / Extended-Depth-of-Field Telecentric Lens | Uses a smaller object-side aperture angle to maintain telecentric imaging while increasing the range over which objects remain acceptably sharp. | Typically below 0.2° within the specified aperture and field. | Usually below 0.2% to 0.5%. | Fixed working distance with greater tolerance to moderate height variation than high-NA designs. | Longer depth of field, reduced sensitivity to surface-height changes, lower light collection, and moderate resolution. | Uneven parts, stepped components, packaging inspection, dimensional checks, and objects with variable height. |
| Coaxial-Illumination-Compatible Telecentric Lens | Maintains object-space telecentricity while allowing light to travel through or along the optical axis toward reflective or flat surfaces. | Typically below 0.1° to 0.2%, depending on the integrated illumination path. | Generally below 0.2% in measurement-focused configurations. | Fixed working distance with clearance for an integrated beam splitter or coaxial lighting module. | Axial illumination, reduced shadowing, improved image uniformity on flat surfaces, and low perspective error. | Silicon wafers, glass, printed markings, flat machined surfaces, electronic packages, and bore inspection. |
| Object-Space Telecentric Lens with Adjustable Aperture | Uses an aperture stop located near the object-side telecentric pupil; changing the aperture alters numerical aperture while preserving the telecentric layout within limits. | Often below 0.1° to 0.2% across the supported aperture range. | Commonly below 0.2% when used within the specified aperture settings. | Fixed working distance; aperture changes may affect depth of field, resolution, and illumination requirements. | Trade-off between resolution, depth of field, diffraction, and light throughput can be tuned for the application. | Flexible metrology stations, research systems, variable-surface inspection, and applications requiring controlled depth of field. |
| Selection note: Object-space telecentricity is defined by the chief rays being parallel, or nearly parallel, on the object side. The most important specification is the permitted magnification change over the stated object-distance range. Actual performance depends on magnification, sensor format, aperture setting, field position, wavelength, working distance, and alignment accuracy. Values shown are representative engineering ranges rather than universal limits. |